Plasma Focused Ion Beam System & Time-of-Flight Secondary Ion Mass Spectrometry
- 采购方
- CANADABUYS
- 机构全称
- McMaster University
- 国家/地区
- Canada
- 截止时间
- 2026-11-27
- 发布时间
- 2026-11-02
- 公告编号
- MX-243100757542
- 来源编号
- 1518582
公告概况
Background and Purpose McMaster University and the Canadian Centre for Electron Microscopy (CCEM) have a requirement for one (1) plasma focused ion beam scanning electron microscope (PFIB-SEM) with multiple selectable ion species and integrated time-of-flight secondary ion mass spectrometry (ToF-SIM
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