Semi-automatic prober for characterization of 200 mm wafers
- Agency
- TED
- Full Agency
- IHP GmbH - Leibniz-Institut für innovative Mikroelektronik
- Country
- Germany
- Deadline
- 13-Oct-2026 12:00
- Published
- 14-Sep-2026
- Reference
- 279074a6-1745-4fe1-814d-f709007498e7
- Source ID
- 6318562026
Notice Overview
Supply, delivery, installation, commissioning and integration of a semi-automatic wafer prober system for the electrical and temperature-dependent characterization of 200 mm wafers. The system shall support DC and pulsed I-V as well as low-frequency impedance measurements up to 10 MHz and shall be i
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